![]() SLD500 |
![]() SLD300 |
● High Precision Stage System
● Flexible Substrate Applications
● Rich Application Experience
● Excellent Optical System
● Precise Thermal Effect Control
● Low COO
Model | SLD500 | SLD300 |
Wafer Size | 6"/8"/12" Wafer (Si) | 2"/4"/6" WaferSiC |
Wafer Thickness | 50μm≤ Taiko≤ 150μm 150μm≤ Non-Taiko≤ 800μm 800μm≤ Bonding≤ 1200μm |
150μm≤Non-Taiko≤800μm |
Scanning Mode | Scan & Step | Scan & Step |
Activation Depth | ≥3μm (≥4μm Option) | / |